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La recherche des mots clé

1

Semiconductor Memories: Technology, Testing, and Reliability

Semiconductor Memories: Technology, Testing, and Reliability

Wiley-IEEE Press

Ashok K. Sharma

Année:

2002

Langue:

english

Fichier:

PDF, 11.31 MB

0 / 0

english, 2002

2

Testing Static Random Access Memories: Defects, Fault Models and Test Patterns

Testing Static Random Access Memories: Defects, Fault Models and Test Patterns

Said Hamdioui (auth.)

Année:

2004

Langue:

english

Fichier:

PDF, 6.27 MB

0 / 0

english, 2004

3

Testing and Testable Design of High-Density Random-Access Memories

Testing and Testable Design of High-Density Random-Access Memories

Pinaki Mazumder, Kanad Chakraborty (auth.)

Année:

1996

Langue:

english

Fichier:

PDF, 10.16 MB

0 / 0

english, 1996

4

Radiation Effects in Semiconductors (Devices, Circuits, and Systems)

Radiation Effects in Semiconductors (Devices, Circuits, and Systems)

Krzysztof Iniewski

Année:

2010

Langue:

english

Fichier:

PDF, 10.79 MB

0 / 0

english, 2010

5

Rad-hard Semiconductor Memories

Rad-hard Semiconductor Memories

River Publishers

Cristiano Calligaro (editor), Umberto Gatti (editor)

Année:

2018

Langue:

english

Fichier:

PDF, 37.80 MB

0 / 5.0

english, 2018

6

Terrestrial Radiation Effects in ULSI Devices and Electronic Systems

Terrestrial Radiation Effects in ULSI Devices and Electronic Systems

Année:

2015

Langue:

english

Fichier:

PDF, 4.39 MB

0 / 0

english, 2015

7

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test

Année:

2008

Langue:

english

Fichier:

PDF, 10.62 MB

0 / 0

english, 2008

8

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test

Andrei Pavlov, Manoj Sachdev

Année:

2008

Langue:

english

Fichier:

PDF, 7.82 MB

0 / 0

english, 2008

9

Corporate Vision and Rapid Technological Change: The Evolution of Market Structure

Corporate Vision and Rapid Technological Change: The Evolution of Market Structure

Année:

1993

Langue:

english

Fichier:

PDF, 3.39 MB

0 / 0

english, 1993

10

Corporate Vision and Rapid Technological Change: The Evolution of Market Structure

Corporate Vision and Rapid Technological Change: The Evolution of Market Structure

Jas Gill, Peter Swann

Année:

1993

Langue:

english

Fichier:

PDF, 3.39 MB

0 / 0

english, 1993

11

YHT Cover.qxd

YHT Cover.qxd

Année:

2016

Langue:

english

Fichier:

PDF, 2.52 MB

0 / 0

english, 2016

12

Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel (auth.)

Année:

2010

Langue:

english

Fichier:

PDF, 4.30 MB

0 / 0

english, 2010

13

Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel (auth.)

Année:

2010

Langue:

english

Fichier:

PDF, 5.71 MB

0 / 0

english, 2010

14

Energy Efficient and Reliable Embedded Nanoscale SRAM Design

Energy Efficient and Reliable Embedded Nanoscale SRAM Design

Bhupendra Singh Reniwal, Pooran Singh, Ambika Prasad Shah, Santosh Kumar Vishvakarma

Année:

2023

Langue:

english

Fichier:

PDF, 33.92 MB

0 / 5.0

english, 2023

15

TFET Integrated Circuits: From Perspective Towards Reality

TFET Integrated Circuits: From Perspective Towards Reality

Springer International Publishing;Springer

Navneet Gupta, Adam Makosiej, Amara Amara, Andrei Vladimirescu, Costin Anghel

Année:

2021

Langue:

english

Fichier:

PDF, 7.35 MB

0 / 0

english, 2021

16

Circuit design for reliability

Circuit design for reliability

Reis, Ricardo Augusto da Luz

Année:

2015

Langue:

english

Fichier:

PDF, 11.71 MB

0 / 5.0

english, 2015

17

Circuit Design for Reliability

Circuit Design for Reliability

Springer-Verlag New York

Ricardo Reis, Yu Cao, Gilson Wirth (eds.)

Année:

2015

Langue:

english

Fichier:

PDF, 11.71 MB

0 / 0

english, 2015

18

SOI Design: Analog, Memory and Digital Techniques

SOI Design: Analog, Memory and Digital Techniques

Andrew Marshall, Sreedhar Natarajan (auth.)

Année:

2003

Langue:

english

Fichier:

PDF, 24.53 MB

0 / 0

english, 2003

19

SOI Design: Analog, Memory and Digital Techniques

SOI Design: Analog, Memory and Digital Techniques

Andrew Marshall, Sreedhar Natarajan

Année:

2001

Langue:

english

Fichier:

PDF, 21.35 MB

0 / 0

english, 2001

20

SOI Design Analog Memory and Digital Techniques

SOI Design Analog Memory and Digital Techniques

Andrew Marshall, Sreedhar Natarajan

Année:

2001

Langue:

english

Fichier:

RAR, 26.98 MB

0 / 0

english, 2001

21

SOI Design Analog, Memory and Digital Techniques

SOI Design Analog, Memory and Digital Techniques

Kluwer Academic Publishers

Andrew Marshall, Sreedhar Natarajan

Année:

2003

Langue:

english

Fichier:

PDF, 28.28 MB

0 / 0

english, 2003

22

SOI design : analog, memory and digital techniques

SOI design : analog, memory and digital techniques

Kluwer Academic Publishers

Andrew Marshall, Sreedhar Natarajan

Année:

2002

Langue:

english

Fichier:

PDF, 28.74 MB

0 / 0

english, 2002

23

Advanced Low-Power Digital Circuit Techniques (The Springer International Series in Engineering and Computer Science, 405)

Advanced Low-Power Digital Circuit Techniques (The Springer International Series in Engineering and Computer Science, 405)

Elrabaa, Muhammad S., Abu-Khater, Issam S., Elmasry, Mohamed I.

Année:

1997

Langue:

english

Fichier:

PDF, 54.98 MB

0 / 4.0

english, 1997

24

Advanced Low-Power Digital Circuit Techniques

Advanced Low-Power Digital Circuit Techniques

Muhammad S. Elrabaa, Issam S. Abu-Khater, Mohamed I. Elmasry (auth.)

Année:

1997

Langue:

english

Fichier:

PDF, 54.98 MB

0 / 0

english, 1997

25

Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices

Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices

World Scientific Publishing Company

Takashi Nakamura, Eishi Yahagi, Hideaki Kameyama, Mamoru Baba

Année:

2008

Langue:

english

Fichier:

PDF, 13.97 MB

0 / 0

english, 2008

26

Application-Specific Mesh-based Heterogeneous FPGA Architectures

Application-Specific Mesh-based Heterogeneous FPGA Architectures

Springer-Verlag New York

Husain Parvez, Habib Mehrez (auth.)

Année:

2011

Langue:

english

Fichier:

PDF, 10.62 MB

0 / 0

english, 2011

27

Application-Specific Mesh-based Heterogeneous FPGA Architectures

Application-Specific Mesh-based Heterogeneous FPGA Architectures

Springer-Verlag New York

Husain Parvez, Habib Mehrez (auth.)

Année:

2011

Langue:

english

Fichier:

PDF, 6.79 MB

0 / 0

english, 2011

28

High performance memory testing: design principles, fault modeling, and self-test

High performance memory testing: design principles, fault modeling, and self-test

Année:

2003

Langue:

english

Fichier:

PDF, 9.29 MB

0 / 0

english, 2003

29

Application-Specific Mesh-based Heterogeneous FPGA Architectures

Application-Specific Mesh-based Heterogeneous FPGA Architectures

Springer-Verlag New York

Husain Parvez, Habib Mehrez (auth.)

Année:

2011

Langue:

english

Fichier:

PDF, 6.98 MB

0 / 0

english, 2011

30

High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test

High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test

Année:

2002

Langue:

english

Fichier:

RAR, 9.44 MB

0 / 0

english, 2002

31

High Performance Memory Testing Design Principles Fault Modeling

High Performance Memory Testing Design Principles Fault Modeling

Année:

2002

Langue:

english

Fichier:

PDF, 10.98 MB

5.0 / 0

english, 2002

32

Dependability in electronic systems: mitigation of hardware failures, soft errors, and electro-magnetic disturbances

Dependability in electronic systems: mitigation of hardware failures, soft errors, and electro-magnetic disturbances

Kanekawa, Nobuyasu, Ibe, Eishi H, Suga, Takashi, Uematsu, Yutaka

Année:

2010

Langue:

english

Fichier:

PDF, 5.51 MB

0 / 5.0

english, 2010

33

Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances

Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances

Springer-Verlag New York

Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu (auth.)

Année:

2011

Langue:

english

Fichier:

PDF, 12.78 MB

0 / 0

english, 2011

34

Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances

Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances

Springer-Verlag New York

Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu (auth.)

Année:

2011

Langue:

english

Fichier:

PDF, 12.84 MB

0 / 0

english, 2011

35

Memory Design Techniques for Low Energy Embedded Systems

Memory Design Techniques for Low Energy Embedded Systems

Alberto Macii, Luca Benini, Massimo Poncino (auth.)

Année:

2002

Langue:

english

Fichier:

PDF, 7.36 MB

0 / 0

english, 2002

36

CMOS Memory Circuits

CMOS Memory Circuits

Tegze P. Haraszti

Année:

2000

Langue:

english

Fichier:

PDF, 12.10 MB

0 / 0

english, 2000

37

ELRAD 08/95

ELRAD 08/95

Heise Zeitschriften Verlag GmbH & Co. KG, Hannover

Année:

1995

Langue:

german

Fichier:

PDF, 44.57 MB

0 / 4.0

german, 1995

38

ELRAD 03/97

ELRAD 03/97

Heise Zeitschriften Verlag GmbH & Co. KG, Hannover

Année:

1997

Langue:

german

Fichier:

PDF, 43.80 MB

0 / 4.0

german, 1997

39

YHT Cover.qxd

YHT Cover.qxd

Année:

2014

Langue:

english

Fichier:

PDF, 1.33 MB

0 / 0

english, 2014

40

120-мм минометные системы

120-мм минометные системы

Langue:

russian

Fichier:

RTF , 199 KB

0 / 0

russian

41

Cmos Memory Circuits T Haraszti

Cmos Memory Circuits T Haraszti

Année:

2006

Langue:

spanish

Fichier:

AZW3 , 22.59 MB

0 / 0

spanish, 2006

42

CMOS Memory Circuits T Haraszti 2000

CMOS Memory Circuits T Haraszti 2000

pdfintroduction

Année:

2006

Langue:

spanish

Fichier:

AZW3 , 22.59 MB

0 / 0

spanish, 2006

43

Scanned Document

Scanned Document

Langue:

portuguese

Fichier:

PDF, 19.51 MB

0 / 0

portuguese

44

Rechnerarchitektur Rechenbeispiele

Rechnerarchitektur Rechenbeispiele

Année:

2010

Langue:

german

Fichier:

PDF, 598 KB

0 / 0

german, 2010

45

Зарубежные самоходные минометы калибра 120 миллиметров

Зарубежные самоходные минометы калибра 120 миллиметров

Langue:

russian

Fichier:

PDF, 1.48 MB

0 / 0

russian

46

Cmos Memory Circuits T Haraszti

Cmos Memory Circuits T Haraszti

Année:

2006

Fichier:

LIT , 22.61 MB

0 / 0

2006

47

CMOS Memory Circuits T Haraszti 2000

CMOS Memory Circuits T Haraszti 2000

Année:

2006

Fichier:

LIT , 22.61 MB

0 / 0

2006

48

Мир мобильных минометов

Мир мобильных минометов

Langue:

russian

Fichier:

PDF, 982 KB

0 / 0

russian

49

孔融让梨

孔融让梨

哈尔滨：黑龙江美术出版社

崔钟雷主编

Année:

2015

Langue:

chinese

Fichier:

PDF, 6.26 MB

0 / 0

chinese, 2015